AQ6370D Telekom Optik Spektrum Analizörü 600 - 1700 nm

AQ7933 is application software to display and analyze the waveform data measured on a YOKOGAWA OTDR and create and output reports of analysis results on a PC. It displays up to 20 waveforms at the same time and creates a work report in 3 steps. The software integrates applications that the previous software doesn’t have, such as the OTDR remote controller, and assists field engineers in their waveform confirmation work.

AQ7932 is application software that performs analysis of trace data from the OTDR on a PC, and conveniently creates professional reports. The built-in report creation wizard function makes this task simple, quick and easy. Display up to eight traces on screen, and perform a variety of analyses including multi-trace analysis and differential trace analysis for comparing recent waveforms with old ones, and use the 2 way trace analysis function for analyzing average values of data measured from both directions in the optical fiber.

The AQ6150B Optical Wavelength Meter is an ideal instrument for accurately measuring the optical wavelength of optical devices and systems with wavelength ranges from 900 nm to 1700 nm. By employing a Michelson interferometer and a high speed Fast Fourier Transform (FFT) algorithm, the AQ6150B can measure not only a single wavelength laser signal, but also a multiple wavelength laser signal from a DWDM system and Fabry-Perot laser. Furthermore, this technology enables the measurement of modulated laser signals in addition to the CW signal from an optical transceiver. The optimized optical design and data processing routine significantly reduces the measurement time and improves manufacturing throughput.

The AQ2200-642 reduces the complexity and cost of 10G optical transceiver testing by combining bus and power control features into the same mainframe that performs Signal Generation, BERT and Optical testing. This allows a single programming interface to control all aspects of the transceiver test, simplifying test setup, decreasing test time and increasing productivity. The wiring complexity and test bench size are reduced by replacing separate Digital Multi-Meters, Programmable Power supplies and Serial I/F controllers with a single module.